Four-point Resistance Measurements of Wires Written with a Scanning Tunneling Microscope, in Atomic and Nanoscale Modification of Materials
Document Type
Book
Role
Contributor
Publication
Atomic and Nanometer-Scale Modfication of Materials, Fundamentals and Applications
Publisher
Kluwer Academic Publishing
Standard Number
0792323343
Publication Date
1993
Repository Citation
De Lozanne, A. L., E. E. Ehrichs, and Walter F. Smith. "Four-point Resistance Measurements of Wires Written with a Scanning Tunneling Microscope, in Atomic and Nanoscale Modification of Materials." Atomic and Nanometer-scale Modification of Materials, Fundamentals and Applications. By Phaedon Avouris. Dordrecht: Kluwer Academic, 1993. Print.
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