Four-point Resistance Measurements of Wires Written with a Scanning Tunneling Microscope, in Atomic and Nanoscale Modification of Materials
Document Type
Book Chapter
Role
Contributor
Published In
Atomic and Nanometer-Scale Modfication of Materials, Fundamentals and Applications
Publisher
Kluwer Academic Publishing
Publication Date
1993
Suggested Citation
De Lozanne, A. L., E. E. Ehrichs, and Walter F. Smith. "Four-point Resistance Measurements of Wires Written with a Scanning Tunneling Microscope, in Atomic and Nanoscale Modification of Materials." Atomic and Nanometer-scale Modification of Materials, Fundamentals and Applications. By Phaedon Avouris. Dordrecht: Kluwer Academic, 1993. Print.
