Four-probe Resistance Measurements of Nickel Wires Written with a Scanning Tunneling Microscope / Scanning Electron Microscope System

Authors

Edward E. Ehrichs
Walter Fox Smith, Haverford CollegeFollow
Alejandro L. de Lozanne

Document Type

Journal Article

Role

Author

Published In

Ultramicroscopy

Volume

42-44

First Page

1438

Last Page

1442

Publication Date

1992

Suggested Citation

Ehrichs, E. E., W. F. Smith, and A. L. De Lozanne. "Four-probe resistance measurements of nickel wires written with a scanning tunneling microscope/scanning electron microscope system." Ultramicroscopy 42 (1992): 1438-1442.