"Four-probe Resistance Measurements of Nickel Wires Written with a Scan" by Edward E. Ehrichs, Walter Fox Smith et al.
 

Four-probe Resistance Measurements of Nickel Wires Written with a Scanning Tunneling Microscope / Scanning Electron Microscope System

Document Type

Journal Article

Role

Author

Standard Number

0304-3991

Journal Title

Ultramicroscopy

Volume

42-44

First Page

1438

Last Page

1442

Publication Date

1992

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