A Purely Logical Characterization of Circuit Uniformity

Authors

Steven Lindell, Haverford CollegeFollow

Document Type

Conference Proceeding

Role

Contributor

Publication

Proceedings of the 7th Annual IEEE Conference on Structure in Complexity Theory

First Page

185

Last Page

192

Publication Date

1992

Repository Citation

"A Purely Logical Characterization of Circuit Uniformity" in Proceedings of the 7th Annual IEEE Conference on Structure in Complexity Theory, (1992), pp. 185-192.